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0204995 - UPT-D 980026 RIV MX eng C - Conference Paper (international conference)
Zadražil, Martin - El Gomati, M. M.
Measurements of the secondary and backscattered electron coefficients in the energy range 250-5000eV.
Proceedings of the 14th International Congress on Electron Microscopy. Bristol: Institute of Physics Publishing Ltd., 1998 - (Benavides, H.; Yacamán, M.), s. 495-496. ISBN 0-7503-0568-1.
[ICEM /14./ - International Congress on Electron Microscopy. Cancun (MX), 31.08.1998-04.09.1998]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100615