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0204994 - UPT-D 980025 RIV MX eng C - Conference Paper (international conference)
Zadražil, Martin - Frank, Luděk - Müllerová, Ilona
Noncharging scanning electron microscopy of non-conductors at automatically adjusted critical energies.
Proceedings of the 14th International Congress on Electron Microscopy. Bristol: Institute of Physics Publishing Ltd., 1998 - (Benavides, H.; Yacamán, M.), s. 457-458. ISBN 0-7503-0568-1.
[ICEM /14./ - International Congress on Electron Microscopy. Cancun (MX), 31.08.1998-04.09.1998]
R&D Projects: GA ČR GA202/96/0961
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100614