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0204585 - UPT-D 940001 RIV CZ eng J - Journal Article
Frank, Luděk - El Gomati, M. M.
Auger Electron Microscopy: An Overview.
Czechoslovak Journal of Physics. Roč. 44, č. 3 (1994), s. 173-193. ISSN 0011-4626.
[Secondary Electrons in Electron Spectroscopy, Microscopy, and Microanalysis. Chlum, 21.09.1993-24.09.1993]
Impact factor: 0.330, year: 1994
Permanent Link: http://hdl.handle.net/11104/0002824