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0179050 - UFP-V 20020067 US eng P - Patent Document
Sampath, S. - Matějíček, Jiří
Method and Apparatus for Determining Process-Induced Stresses and Modulus of Coatings by in-situ Measurement.
Stony Brook, NY, US: The Research Foundation of State University of New York, 2002. 20000303. Date of the patent acceptance: 20021112. 12 s. Patent Number: 6478875
Institutional research plan: CEZ:AV0Z2043910
Keywords : determining process
Subject RIV: JB - Sensors, Measurment, Regulation
Permanent Link: http://hdl.handle.net/11104/0075863