0134455 - FZU-D 20030355 RIV CZ eng C - Conference Paper (international conference)
Pavlíček, PavelHeight profile measurement by means of white-light interferometry.
Engineeting Mechanics 2003. Žd'ár nad Sázavou: Institute of Theoretical and Applied Mechanics, Academy of Siences of the Czech Republic, 2003 - (Náprstek, J.; Fischer, C.), s. 1-7
[National Conference with International Participation "Engineering Mechanics 2003". Svratka (CZ), 12.05.2003-15.05.2003]
R&D Projects: GA MŠMT LN00A015
Institutional research plan: CEZ:AV0Z1010921
Keywords : white-light interferometry * rough surface -height profile
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0032356
