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0109031 - UPT-D 20040032 RIV BE eng C - Conference Paper (international conference)
Konvalina, Ivo - Müllerová, Ilona - Frank, Luděk
The collection efficiency of the Everhart-Thornley detector of secondary electrons in SEM.
[Sběrová účinnost Everhart-Thornley-ho detektoru sekundárních elektronů v REM.]
EMC 2004 - Proceedings of the 13th European Microscopy Congress. Vol. 1. Liege: Belgian Society for Microscopy, 2004, s. 79-80.
[EMC 2004 /13./ European Microscopy Congress. Antwerp (BE), 22.08.2004-27.08.2004]
R&D Projects: GA AV ČR IAA1065304
Keywords : scanning electron microscopy * collection efficiency * secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0016143