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0100019 - UPT-D 20040019 RIV CZ eng C - Conference Paper (international conference)
Müllerová, Ilona - Frank, Luděk
Examination of electronic structures and materials in scanning low energy electron microscope (SLEEM).
[Zkoumání elektronických struktur a materiálů v rastrovacím nízko-energiovém elektronovém mikroskopu (SLEEM).]
Proceedings of the International Conference NANO'03. Praha: ČSNMT, 2003, s. 87-92. ISBN 80-214-2527-X.
[NANO'03 International Conference. Brno (CZ), 21.09.2003-23.09.2003]
R&D Projects: GA AV ČR IAA1065304
Keywords : SLEEM * electronic structures of the specimen * image resolutions
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0007526