0089826 - ÚTAM 2008 RIV SIGLE US eng C - Conference Paper (international conference)
Vavřík, Daniel - Holý, T. - Jakůbek, J. - Jakůbek, M. - Vykydal, Z.Microradiographic Observation of Material Damage Structure.
[Mikroradiografické pozorování struktury materiálového poškození.]
IEEE Nuclear Science Symposium Conference Record. San Diego: Nuclear and Plasma Sciences Society, 2006 - (Phlips, B.), s. 1081-1083. ISBN 1-4244-0561-0. ISSN 1082-3654.
[IEEE Nuclear Science Symposium. San Diego (US), 29.10.2006-04.11.2006]
R&D Projects: GA ČR(CZ) GA106/04/0567; GA MŠMT(CZ) 1P04LA211; GA MŠMT(CZ) LC06041; GA MPO(CZ) 1H-PK2/05
Institutional research plan: CEZ:AV0Z20710524
Keywords : Defectoscopy * Damage * Single Photon Counting X-ray Detector * Medipix
Subject RIV: JB - Sensors, Measurment, Regulation
Permanent Link: http://hdl.handle.net/11104/0150911
