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0082251 - ÚPT 2007 RIV JP eng J - Journal Article
Frank, Luděk - Mika, Filip - Hovorka, Miloš - Valdaitsev, D. - Schönhense, G. - Müllerová, Ilona
Dopant Contrast in Semiconductors as Interpretation Challenge at Imaging by Electrons.
[Kontrast dopantu jako interpretační problém při zobrazování elektrony.]
Materials Transactions. Roč. 48, č. 5 (2007), s. 936-939. ISSN 1345-9678. E-ISSN 1347-5320
R&D Projects: GA ČR GA202/04/0281
Institutional research plan: CEZ:AV0Z20650511
Keywords : electron microscopic contrasts * semiconductors * dopant contrast * scanning electron microscopy * scanning low energy electron microscopy * photoelectron emission microscopy
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.018, year: 2007
Permanent Link: http://hdl.handle.net/11104/0145867