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0050911 - ÚPT 2007 RIV JP eng C - Conference Paper (international conference)
Frank, Luděk - Müllerová, Ilona - Valdaitsev, D. - Nepijko, S. - Gloskovskii, A. - Elmers, H. - Schönhense, G.
Origin of the dopant contrast in PEEM micrographs.
[Původ kontrastu dopantu v mikrosnímcích PEEM.]
The 5th International Conference on LEEM/PEEM. Himeji: JSRRI, 2006, s. 220.
[LEEM/PEEM /5./. Himeji (JP), 15.10.2006-19.10.2006]
Institutional research plan: CEZ:AV0Z20650511
Keywords : PEEM * dopant contrast
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0140941