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0043768 - ÚPT 2007 RIV US eng J - Journal Article
Konvalina, Ivo - Müllerová, Ilona
The Trajectories of Secondary Electrons in the Scanning Electron Microscope.
[Trajektorie sekundárních elektronů v rastrovacím elektronovém mikroskopu.]
Scanning. Roč. 28, č. 5 (2006), s. 245-256. ISSN 0161-0457. E-ISSN 1932-8745
R&D Projects: GA ČR GA102/05/2327
Institutional research plan: CEZ:AV0Z20650511
Keywords : ET detector * secondary electrons * collection efficiency
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.462, year: 2006
Permanent Link: http://hdl.handle.net/11104/0136679