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  1. 1.
    0043694 - FZÚ 2007 RIV US eng C - Conference Paper (international conference)
    Chobola, Z. - Vaněk, J. - Hulicius, Eduard - Šimeček, Tomislav
    Noise as a diagnostic tool for quality of GaSb laser diodes.
    [Šum jako diagnostický nástroj pro určení kvality GaSb laserových diod.]
    Proceedings of MIEL 2006. Danvers: IEEE, 2006, s. 307-308. ISBN 1-4244-0116-X.
    [International Conference on Microelectronics /25./. Belgrade (CS), 14.05.2006-17.05.2006]
    R&D Projects: GA ČR(CZ) GA102/04/0142
    Institutional research plan: CEZ:AV0Z10100521
    Keywords : laser diode * 1/f noise * GaSb
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Permanent Link: http://hdl.handle.net/11104/0136616