0022403 - ÚPT 2006 RIV CH eng C - Conference Paper (international conference)
Konvalina, Ivo - Müllerová, IlonaFactors affecting the Collection Efficiency of Secondary Electrons in SEM.
[Faktory ovlivňující sběrovou účinnost sekundárních elektronů v REM.]
Proceedings - Microscopy Conference 2005 - Dreiländertagung /6./. Villigen: Paul Scherrer Institute, 2005, s. 48. ISBN N. ISSN 1019-6447.
[Dreiländertagung Microscopy Conference (MC 2005). Davos (CH), 28.08.2005-02.09.2005]
R&D Projects: GA AV ČR(CZ) IAA1065304
Keywords : ET detector * secondary electrons * collection efficiency
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0111143
