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0022382 - ÚPT 2006 RIV JP eng J - Journal Article
Matsuda, K. - Ikeno, S. - Müllerová, Ilona - Frank, Luděk
The potential of the scanning low energy electron microscopy for the examination of aluminum based alloys and composites.
[Využití rastrovací elektronové mikroskopie s pomalými elektrony při studiu slitin a kompozitů na bázi hliníku.]
Journal of Electron Microscopy. Roč. 54, č. 2 (2005), s. 109-117. ISSN 0022-0744
R&D Projects: GA AV ČR(CZ) IAA1065304
Keywords : scanning low energy electron microscopy * precipitates in Al-Mg-Si alloys * Al-alloy-base/ceramic composite
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 0.720, year: 2005
Permanent Link: http://hdl.handle.net/11104/0111123