0456646 - FZÚ 2016 RIV CH eng M - Monography Chapter
Hapala, Prokop - Ondráček, Martin - Stetsovych, Oleksandr - Švec, Martin - Jelínek, Pavel
Simultaneous nc-AFM/STM measurements with atomic resolution.
Noncontact Atomic Force Microscopy. Cham: Springer International Publishing, 2015 - (Morita, S.; Giessibl, F.; Meyer, E.; Wiesendanger, R.), s. 29-49. NanoScience and Technology, 3. ISBN 978-3-319-15587-6
R&D Projects: GA ČR(CZ) GA14-02079S
Institutional support: RVO:68378271
Keywords : AFM * STM * DFT simulations * electron transport * atomic contrast
Subject RIV: BM - Solid Matter Physics ; Magnetism
DOI: https://doi.org/10.1007/978-3-319-15588-3_3
Permanent Link: http://hdl.handle.net/11104/0257148