Basket | The Czech Academy of Sciences

1.

0367356 - ÚPT 2012 RIV US eng J - Journal Article
Gescheidtová, E. - Marcon, P. - Bartušek, Karel
Visualization of Plant Fibres via Difusion Tensor Imaging.
PIERS Online. Roč. 7, č. 6 (2011), s. 543-546. ISSN 1931-7360
R&D Projects: GA ČR GAP102/11/0318
Institutional research plan: CEZ:AV0Z20650511
Keywords : plant fibres * difusion weighted imaging * difusion tensor imaging * MR imaging
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
DOI: https://doi.org/10.2529/PIERS110217033410
Permanent Link: http://hdl.handle.net/11104/0202065

2.

0427500 - ÚCHP 2015 RIV NL eng J - Journal Article
Dytrych, Pavel - Klusoň, Petr - Dzik, P. - Veselý, M. - Morozová, Magdalena - Sedláková, Zuzana - Šolcová, Olga
Photo-Electrochemical Properties of ZnO and TiO2 Layers in Ionic Liquids Environment.
Catalysis Today. Roč. 230, JUL (2014), s. 152-157. ISSN 0920-5861. E-ISSN 1873-4308.
[International Conference on Semiconductor Photochemistry (SP4) /4./. Prague, 23.06.2013-28.06.2013]
R&D Projects: GA TA ČR TA03010548
Institutional support: RVO:67985858
Keywords : room temperature ionic liquids * piezoelectric jet printing * semiconducting metal oxides
Subject RIV: CI - Industrial Chemistry, Chemical Engineering
Impact factor: 3.893, year: 2014 ; AIS: 0.9, rok: 2014
DOI: https://doi.org/10.1016/j.cattod.2013.10.048
Permanent Link: http://hdl.handle.net/11104/0233372

	File	Download	Size	Commentary	Version	Access
	0427500.pdf	12	5.2 MB		Author’s postprint	open-access

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6.

0551132 - ÚPT 2022 RIV US eng A - Abstract
Müllerová, Ilona - Konvalina, Ivo - Materna Mikmeková, Eliška
Methods of the electron induced cleanning in SEM.
Microscopy and Microanalysis. Cambridge University Press. Roč. 27, S1 (2021), s. 2016-2017. ISSN 1431-9276. E-ISSN 1435-8115
Institutional support: RVO:68081731
Keywords : SEM * contamination * electron beam cleaning * graphene
OECD category: Electrical and electronic engineering
Result website:
https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/methods-of-the-electron-induced-cleanning-in-sem/54D0340450B8B0BEA7DAD306BCE1C21BDOI: https://doi.org/10.1017/S1431927621007327
Permanent Link: http://hdl.handle.net/11104/0326577