0616622 - ÚPT 2025 GB eng A - Abstract
Müllerová, Ilona - Konvalina, Ivo - Paták, Aleš - Průcha, Lukáš - Piňos, Jakub - Zouhar, Martin - Materna Mikmeková, Eliška
Scanning Low Energy Electron Microscopy and Time-of-Flight Spectroscopy Capabilities for Study of Advanced 2D Materials and Thin Foils.
Microscopy and Microanalysis. Cambridge University Press. Roč. 30, S1 (2024), s. 652-653. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2024. Annual Meeting Microscopy Society of America /82./ Annual Meeting Microanalysis Society /58./. 28.07.2024-01.08.2024, Cleveland]
R&D Projects: GA TA ČR(CZ) TN02000020; GA ČR(CZ) GA22-34286S
Institutional support: RVO:68081731
Keywords : scanning low energy electron microscopy * time-of-flight spectroscopy * graphene * EELS spectra * 2D materials
OECD category: Electrical and electronic engineering
Result website:
https://academic.oup.com/mam/article/30/Supplement_1/ozae044.309/7720445DOI: https://doi.org/10.1093/mam/ozae044.309
Permanent Link: https://hdl.handle.net/11104/0363611