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0579808 - FZÚ 2025 RIV US eng J - Journal Article
Kuliček, J. - Marek, M. - Kumar, N. - Fait, Jan - Potocký, Š. - Stehlík, Štěpán - Kromka, Alexander - Rezek, B.
Kelvin probe characterization of nanocrystalline diamond films with SiV centers as function of thickness.
Physica Status Solidi A. Roč. 221, č. 8 (2024), č. článku 2300459. ISSN 1862-6300. E-ISSN 1862-6319
R&D Projects: GA ČR(CZ) GF23-04322L
Grant - others:AV ČR(CZ) LQ100102001
Program: Prémie Lumina quaeruntur
Institutional support: RVO:68378271
Keywords : Kelvin probe * nanodiamond films * silicon vacancy (SiV) centers * thicknesses * work functions
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 2, year: 2022
Method of publishing: Open access
Permanent Link: https://hdl.handle.net/11104/0353241