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  1. 1.
    0567887 - ÚTAM 2024 RIV eng P - Patent Document
    Vavřík, Daniel
    X-ray fluorescence imaging for determining layer thicknesses.
    2023. Owner: Ústav teoretické a aplikované mechaniky AV ČR, v. v. i. Date of the patent acceptance: 04.01.2023. Patent Number: EP3828534. Territorial Protection: evropský patent podle Evropské patentové úmluvy .
    R&D Projects: GA MŠMT(CZ) EF16_019/0000766
    Institutional support: RVO:68378297
    Keywords : stratigraphy * in-situ X-ray methods
    OECD category: Nuclear related engineering
    https://worldwide.espacenet.com/patent/search/family/074099624/publication/EP3828534A1?q=pn%3DEP3828534A1
    Permanent Link: https://hdl.handle.net/11104/0339145
     
     

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