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0566515 - FZÚ 2023 RIV US eng A - Abstract
Klimša, Ladislav - Duchoň, Jan - Svora, Petr - Kopeček, Jaromír
Possible approaches for combined use of xenon and gallium ion sources for task specific focused ion beam sample preparation.
Microscopy and Microanalysis. Cambridge University Press. Roč. 28, č. 1 (2022), s. 26-27. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2022. 31.07.2022-04.08.2022, Portland]
R&D Projects: GA MŠMT LM2018110
Institutional support: RVO:68378271
Keywords : FIB-SEM * plasma FIB-SEM
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Permanent Link: https://hdl.handle.net/11104/0337838