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0565120 - ÚFE 2023 RIV US eng J - Journal Article
Lin, S. - He, Y. - Feng, D. - Piliarik, Marek - Chen, X.
Optical Fingerprint of Flat Substrate Surface and Marker-Free Lateral Displacement Detection with Angstrom-Level Precision.
Physical Review Letters. Roč. 129, č. 21 (2022), č. článku 213201. ISSN 0031-9007. E-ISSN 1079-7114
R&D Projects: GA ČR(CZ) GA22-11753S
Grant - others:AV ČR(CZ) NSFC-21-18
Program: Bilaterální spolupráce
Keywords : Microscopy * Speckle patterns * Sub nanometers
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 8.6, year: 2022
Method of publishing: Limited access
https://doi.org/10.1103/PhysRevLett.129.213201
Permanent Link: https://hdl.handle.net/11104/0338930