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0538009 - FZÚ 2021 RIV GB eng J - Journal Article
Marčišovská, M. - Dudas, D. - Havránek, M. - Kabátová, A. - Kafka, V. - Kostina, A. - Macková, A. - Marcisovský, M. - Mitrofanov, S. V. - Popule, Jiří - Romanenko, Oleksandr V. - Tomášek, L. - Vrba, V.
TID and SEU testing of the novel X-CHIP-03 monolithic pixel detector.
Journal of Instrumentation. Roč. 15, č. 1 (2020), s. 1-11, č. článku C01043. ISSN 1748-0221. E-ISSN 1748-0221
R&D Projects: GA MŠMT EF16_013/0001812
Institutional support: RVO:68378271 ; RVO:61389005
Keywords : radiation damage to detector materials (solid state) * radiation damage to electronic components * radiation-hard detectors * radiation-hard electronics
OECD category: Particles and field physics; Nuclear physics (UJF-V)
Impact factor: 1.415, year: 2020
Method of publishing: Limited access
https://doi.org/10.1088/1748-0221/15/01/C01043
Permanent Link: http://hdl.handle.net/11104/0315849