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0519329 - FZÚ 2020 RIV GB eng J - Journal Article
Marčišovská, Mária - Benka, T. - Havránek, Miroslav - Hejtmánek, M. - Janoška, Z. - Kafka, V. - Marcisovský, M. - Neue, G. - Popule, Jiří - Svihra, P. - Tomášek, L. - Vančura, P. - Vrba, V.
A comparative study of the TID radiation effects on ASICs manufactured in 180 nm commercial technologies.
Journal of Instrumentation. Roč. 13, č. 12 (2018), s. 1-10, č. článku C12003. ISSN 1748-0221. E-ISSN 1748-0221
Institutional support: RVO:68378271
Keywords : radiation damage to electronic components * radiation-hard detectors * radiation-hard electronics * solid state detectors
OECD category: Particles and field physics
Impact factor: 1.366, year: 2018
Method of publishing: Limited access
https://doi.org/10.1088/1748-0221/13/12/c12003
Permanent Link: http://hdl.handle.net/11104/0304325