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  1. 1.
    0518131 - ÚPT 2020 RIV CZ cze V - Research Report
    Matějka, Milan - Horáček, Miroslav - Meluzín, Petr - Chlumská, Jana - Král, Stanislav - Kolařík, Vladimír - Krátký, Stanislav - Knápek, Alexandr
    SMV-2019-06: Vývoj testovacích preparátů pro REM.
    [SMV-2019-06: Development of test specimens for SEM.]
    Brno: TESCAN Brno s.r.o., 2019. 4 s.
    Source of funding: N - Non-public resources
    Keywords : calibration specimen * relief structure * e-beam lithography * silicon etching * microlithography
    OECD category: Nano-processes (applications on nano-scale)
    Permanent Link: http://hdl.handle.net/11104/0303306
     
     

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