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  1. 1.
    0517208 - ÚPT 2020 RIV CZ cze V - Research Report
    Krátký, Stanislav - Matějka, Milan - Chlumská, Jana - Horáček, Miroslav - Kolařík, Vladimír - Meluzín, Petr - Král, Stanislav
    SMV-2019-03: Tenké membrány.
    [SMV-2019-03: Thin membranes.]
    Brno: FEI Czech Republic, 2019. 5 s.
    Source of funding: N - Non-public resources
    Keywords : e-beam lithography * wet etching * plasma etching * reactive ion etching
    OECD category: Nano-processes (applications on nano-scale)
    Permanent Link: http://hdl.handle.net/11104/0302493
     
     

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