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0499540 - ÚFP 2020 RIV US eng C - Conference Paper (international conference)
Doleček, Roman - Lédl, Vít - Psota, Pavel - Václavík, Jan - Vojtíšek, Petr
Multiwavelength digital holography for polishing tool shape measurement.
Proceedings of SPIE. Rochester: SPIE-int. soc. optical engineering, 2013 - (Bentley, J.; Pfaff, M.), č. článku 88840E. ISBN 978-081949747-5. ISSN 0277786X.
[Optifab 2013. Rochester (US), 14.10.2013-17.10.2013]
R&D Projects: GA MŠMT(CZ) ED2.1.00/03.0079
Institutional support: RVO:61389021
Keywords : polishing * holographic interferometry * multiwavelength * contouring
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0291738