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0487144 - FZÚ 2019 RIV NL eng J - Journal Article
Fait, Jan - Čermák, Jan - Stuchlík, Jiří - Rezek, Bohuslav
Complex nano-patterning of structural, optical, electrical and electron emission properties of amorphous silicon thin films by scanning probe.
Applied Surface Science. Roč. 428, Jan (2018), s. 1159-1165. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA ČR GA15-01809S
Institutional support: RVO:68378271
Keywords : amorphous silicon * nano-templates * nanostructures * electrical conductivity * electron emission * atomic force microscopy
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 5.155, year: 2018
Permanent Link: http://hdl.handle.net/11104/0283326