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  1. 1.
    0205257 - UPT-D 20000033 CZ eng G - Proceedings (international conference)
    Frank, Luděk - Čiampor, F.
    Proceedings of the 12th European Congress on Electron Microscopy - 2. Physical Sciences.
    Brno: Czechoslovak Society for Electron Microscopy, 2000. 688 s. ISBN 80-238-5500-X.
    [EUREM /12./ - European Congress on Electron Microscopy. Brno (CZ), 09.07.2000-14.07.2000]
    Institutional research plan: CEZ:AV0Z2065902
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0100875
     
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  3. 3.def.record 'I2_TF_SHORT' not found in 'CavUnTablesd'
  4. 4.def.record 'I2_TF_SHORT' not found in 'CavUnTablesd'
  5. 5.
    0485706 - ÚFE 2018 RIV US eng C - Conference Paper (international conference)
    Matějec, Vlastimil - Pedlíková, J. - Bartoň, Ivo - Podrazký, Ondřej
    Arsenic sulfide layers for dielectric reflection mirrors prepared from solution.
    Proceedings of SPIE - The International Society for Optical Engineering 2017. Vol. 10603. Bellingham: SPIE: The Society of Photo-Optical Instrumentation Engineers, 2017 - (Fliegel, K.; Páta, P.), č. článku 106030M. SPIE. ISBN 978-1-5106-1702-5. ISSN 0277-786X.
    [Photonics, Devices, and Systems VII 2017. Prague (CZ), 28.08.2017-30.08.2017]
    R&D Projects: GA ČR GA16-10019S
    Institutional support: RVO:67985882
    Keywords : optical properties * solution * arsenic sulfide layer
    OECD category: Electrical and electronic engineering
    DOI: https://doi.org/10.1117/12.2292807
    Permanent Link: http://hdl.handle.net/11104/0280661
     

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