0469283 - ÚFP 2017 RIV US eng C - Conference Paper (international conference)
Peca, M. - Psota, Pavel - Vojtíšek, Petr - Lédl, VítAbsolute and relative surface profile interferometry using multiple frequency-scanned lasers.
Proceedings of SPIE 10151, Optics and Measurement International Conference 2016. Vol. 10151. Bellingham: SPIE, Society of Photo-Optical Instrumentation Engineers, 2016 - (Kovačičinová, J.), č. článku 101510H. SPIE. ISBN 978-1-5106-0753-8. ISSN 0277-786X.
[OAM 2016, Optics and Measurement International Conference 2016. Liberec (CZ), 11.10.2016-14.10.2016]
R&D Projects: GA TA ČR(CZ) TA03010893
Institutional support: RVO:61389021
Keywords : Absolute interferometry * diode laser * surface prole * length measurement
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
http://dx.doi.org/10.1117/12.2263656
Permanent Link: http://hdl.handle.net/11104/0267095
