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0449326 - FZÚ 2016 RIV GB eng J - Journal Article
Šimek, Daniel - Kužel, R. - Rafaja, D.
Reciprocal-space mapping for simultaneous determination of texture and stress in thin films.
Journal of Applied Crystallography. Roč. 39, č. 4 (2006), s. 487-501. ISSN 0021-8898. E-ISSN 1600-5767
Institutional support: RVO:68378271
Keywords : texture * stress * X-ray diffraction * reciprocal space mapping
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 2.495, year: 2006
Permanent Link: http://hdl.handle.net/11104/0250882