0440200 - FZÚ 2015 RIV CH eng C - Conference Paper (international conference)
Remeš, Zdeněk - Vasudevan, R. - Jarolimek, K. - Smets, A.H.M. - Zeman, M.The optical spectra of a-Si:H and a-SiC:H thin films measured by the absolute photothermal deflection spectroscopy (PDS).
Solid State Phenomena. Vol. 213. Zürich: Trans Tech Publications Ltd, 2014, s. 19-28. ISBN 978-3-03785-970-4. ISSN 1662-9779.
[Asian School-Conference on Physics and Technology of Nanostructured Materials (ASCO-Nanomat 2013) /2./. Vladivostok (RU), 20.08.2013-27.08.2013]
R&D Projects: GA MŠMT 7E12029; GA MŠMT LH12236; GA MŠMT LH12186
Institutional support: RVO:68378271
Keywords : amorphous silicon * photothermal deflection spectrosocopy * Tauc gap * Urbach edge
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0243336
