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0438739 - FZÚ 2015 RIV CH eng J - Journal Article
Mistrík, J. - Janíček, P. - Taylor, Andrew - Fendrych, František - Fekete, Ladislav - Jäger, Aleš - Nesládek, M.
Spectroscopic ellipsometry characterization of nano-crystalline diamondfilms prepared at various substrate temperatures and pulsed plasma frequencies using microwave plasma enhanced chemical vapor deposition apparatus with linear antenna delivery.
Thin Solid Films. Roč. 571, č. 1 (2014), s. 230-237. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA ČR GA13-31783S; GA MŠMT(CZ) LM2011026
Grant - others:COST Nano TP(XE) MP0901; OP VK(XE) CZ.1.07/2.3.00/20.0306
Institutional support: RVO:68378271
Keywords : nanocrystalline diamond * thin films * microwave plasma-enhanced chemical vapor deposition * pulsed plasma * low deposition temperature
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.759, year: 2014
Permanent Link: http://hdl.handle.net/11104/0242112