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    1.
    0367280 - ÚPT 2012 RIV DE eng C - Conference Paper (international conference)
    Hovorka, Miloš - Konvalina, Ivo - Frank, Luděk - Mikulík, P.
    Mapping of dopants in silicon by injection of electrons.
    MC 2011 - Microscopy Conference Kiel. Kiel: DGE, 2011, IM7.P198:1-2. ISBN 978-3-00-033910-3.
    [MC 2011 - Microscopy Conference. Kiel (DE), 28.08.2011-02.09.2011]
    R&D Projects: GA AV ČR IAA100650902; GA ČR GAP108/11/2270
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : dopant * silicon * scanning electron microscopy
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0202020
     
    2.
    0437373 - ÚPT 2015 RIV CZ cze V - Research Report
    Pokorný, Pavel - Oulehla, Jindřich
    SMV-2014-08: Konstrukce, vývoj a depozice funkčních vzorků interferenčních filtrů.
    [SMV-2014-08: Design, development and test sample deposition of optical filters.]
    Brno: Kvant s.r.o, 2014. 2 s.
    Source of funding: N - Non-public resources
    Keywords : thin film optics * interference filters * e-beam evaporation
    Subject RIV: BH - Optics, Masers, Lasers
    Permanent Link: http://hdl.handle.net/11104/0240953
     

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