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0436622 - ÚPT 2015 RIV US eng J - Journal Article
Novotná, V. - Hrubanová, Kamila - Nebesářová, J. - Krzyžánek, Vladislav
Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM.
Microscopy and Microanalysis. Roč. 20, S3 (2014), s. 1270-1271. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA MŠMT EE.2.3.20.0103; GA MŠMT(CZ) LO1212; GA ČR(CZ) GA14-20012S; GA TA ČR TE01020118
Institutional support: RVO:68081731
Keywords : mass loss * mass-thickness measurement * low voltage STEM
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.872, year: 2014
Permanent Link: http://hdl.handle.net/11104/0240333