0434164 - ÚPT 2015 RIV US eng C - Conference Paper (international conference)
Lazar, Josef - Holá, Miroslava - Fejfar, Antonín - Stuchlík, Jiří - Kočka, Jan - Oulehla, Jindřich - Číp, OndřejDisplacement measurement with intracavity interferometry.
Optical Micro- and Nanometrology V. (Proceedings of SPIE 9132). Bellingham: SPIE, 2014, 913210:1-6. ISSN 0277-786X.
[Optical Micro- and Nanometrology /5./. Brussels (BE), 15.04.2014-17.04.2014]
R&D Projects: GA ČR GPP102/11/P820; GA MŠMT ED0017/01/01; GA MŠMT EE2.4.31.0016; GA TA ČR TA02010711; GA TA ČR TE01020233; GA TA ČR TA01010995; GA MŠMT(CZ) LO1212
Institutional support: RVO:68081731 ; RVO:68378271
Keywords : antireflective coatings * Fabry–Perot interferometers * interferometry * lasers * photodetectors * refractive index * silicon
Subject RIV: BH - Optics, Masers, Lasers
Permanent Link: http://hdl.handle.net/11104/0238300
