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    1.
    0352416 - ÚPT 2011 RIV BR eng C - Conference Paper (international conference)
    Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk
    Low Energy Reflection and High Angle Reflection of Electrons in the SEM.
    Proceedings of the 17th IFSM International Microscopy Congress. Rio de Janeiro: Sociedade Brasileira de Microscopia e Microanilise, 2010, I3.7: 1-2. ISBN 978-85-63273-06-2.
    [International Microscopy Congress (IMC17) /17./. Rio de Janeiro (BR), 19.09.2010-24.09.2010]
    R&D Projects: GA MŠMT OE08012
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : scanning electron microscopy * crystallinic structure * slow backscattered electrons
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0191924
     
     
    2.
    0429905 - NHU-C 2015 RIV CZ cze J - Journal Article
    Hanousek, Jan - Kočenda, Evžen - Shamshur, Anastasiya
    Efektivita evropských firem.
    [Efficiency of European firms.]
    Politická ekonomie. Roč. 62, č. 3 (2014), s. 303-322. ISSN 0032-3233. E-ISSN 0032-3233
    R&D Projects: GA ČR(CZ) GAP403/12/0080
    Grant - others:UK(CZ) UNCE 204005/2012
    Institutional support: PRVOUK-P23
    Keywords : foreign direct investments * ownership structure * technological efficiency
    Subject RIV: AH - Economics
    Impact factor: 0.650, year: 2014
    http://www.vse.cz/polek/953
    Permanent Link: http://hdl.handle.net/11104/0234880
     
     

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