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0403923 - UIVT-O 201217 CS1 eng C - Conference Paper (international conference)
Šebesta, Václav
The Optimization of Mass Production Yield by the Method of Statistical Derivatives.
Circuit theory and design 85. Proceedings of the 1985 European Conference on Circuit Theory and Design. Prague: Academia, 1985 - (Zima, V.), s. 82-85
[ECCTD'85 /7./. Praha (CS), 02.09.1985-06.09.1985]
Permanent Link: http://hdl.handle.net/11104/0124210