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0390483 - FZÚ 2013 RIV NL eng J - Journal Article
Bartoš, Igor - Romanyuk, Olexandr
Layer-resolved photoelectron diffraction from Si(001) and GaAs(001).
Journal of Electron Spectroscopy and Related Phenomena. Roč. 185, č. 11 (2012), s. 512-517. ISSN 0368-2048. E-ISSN 1873-2526
R&D Projects: GA ČR GAP204/10/0035
Grant - others:AV ČR(CZ) M100101201; AV ČR(CZ) AP0701; Murata Science Foundation(JP) 00295
Program: Akademická prémie - Praemium Academiae
Institutional research plan: CEZ:AV0Z10100521
Keywords : photoelectron diffraction * GaAs(001) * Si(001) * semiconductor surfaces * electron attenuation length
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.706, year: 2012
http://www.sciencedirect.com/science/article/pii/S0368204812001326
Permanent Link: http://hdl.handle.net/11104/0219337