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0383890 - ÚPT 2013 RIV US eng J - Journal Article
Jirák, Josef - Čudek, P. - Neděla, Vilém
Scintillation secondary electron detector for ESEM and SEM.
Microscopy and Microanalysis. Roč. 18, Suppl. 2 (2012), s. 1266-1267. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR GAP102/10/1410; GA MŠMT EE.2.3.20.0103
Institutional support: RVO:68081731
Keywords : environmental scanning electron microscopes * scintillation detector * secondary electrons
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 2.495, year: 2012
Permanent Link: http://hdl.handle.net/11104/0213687