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    1.
    0205487 - UPT-D 20020037 RIV CZ eng C - Conference Paper (international conference)
    Müllerová, Ilona - Frank, Luděk
    Ultrahigh vacuum scanning low energy electron microscope (UHV SLEEM) for surface studies.
    Proceedings of the 2nd annual meeting of the Czechoslovak microscopy society. Brno: CSMS, 2002 - (Frank, L.), s. 79 - 82. ISBN 80-238-8749-1.
    [CSEM. Vranovská Ves (CZ), 08.02.2002-09.02.2002]
    R&D Projects: GA AV ČR IAA1065901
    Institutional research plan: CEZ:AV0Z2065902
    Keywords : UHV SLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0101100
     
     
    2.
    0335294 - ÚPT 2011 RIV CZ eng C - Conference Paper (international conference)
    Mikmeková, Šárka - Hovorka, Miloš - Müllerová, Ilona - Frank, Luděk - Man, O. - Pantělejev, L.
    Study of the Microstructure of the UFG Copper in UHV SLEEM.
    Proceedings of the 4th Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology (CJCS’09). Brno: ISI AS CR, 2009 - (Pokorná, Z.; Mika, F.), s. 19. ISBN 978-80-254-4535-8.
    [CJCS’09 - Czech-Japan-China Cooperative Symposium on Nanostructure of Advanced Materials and Nanotechnology /4./. Brno (CZ), 10.08.2009-14.08.2009]
    R&D Projects: GA MŠMT OE08012
    Institutional research plan: CEZ:AV0Z20650511
    Keywords : UHV SLEEM * EBSD * grain orientations
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0179800
     
     
    3.
    0460199 - ÚPT 2017 RIV CZ eng C - Conference Paper (international conference)
    Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona
    Very low energy STEM/TOF system.
    Proceedings of the 15th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: Institute of Scientific Instruments CAS, 2016 - (Mika, F.), s. 6-7. ISBN 978-80-87441-17-6.
    [International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /15./. Skalský dvůr (CZ), 29.05.2016-03.06.2016]
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : elecvtron microscopy * SLEEM * UHV SLEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    http://www.trends.isibrno.cz/
    Permanent Link: http://hdl.handle.net/11104/0260331
     
     
    4.
    0481149 - ÚPT 2018 AT eng A - Abstract
    Daniel, Benjamin - Radlička, Tomáš - Piňos, Jakub - Frank, Luděk - Müllerová, Ilona
    Very low energy STEM / TOF system.
    Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons (SIMDALEE2017). Book of Abstracts. Wien: Technische Universitaet Wien, 2017. s. 70.
    [SIMDALEE2017. Sources, Interaction with Matter, Detection and Analysis of Low Energy Electrons. 18.09.2017-22.09.2017, Pula]
    EU Projects: European Commission(XE) 606988 - SIMDALEE2
    Institutional support: RVO:68081731
    Keywords : STEM/TOF system * ultrathin films * UHV SLEEM
    OECD category: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0276755
     
     
    5.
    0522221 - ÚPT 2020 US eng A - Abstract
    Mikmeková, Šárka - Jánský, P. - Kolařík, V. - Müllerová, Ilona
    Surface imaging with UHV SLEEM and SEM LEEM.
    Microscopy and Microanalysis. Cambridge University Press. Roč. 25, S2 (2019), s. 444-445. ISSN 1431-9276. E-ISSN 1435-8115.
    [Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : surface imaging * UHV SLEEM * SEM LEEM
    OECD category: Materials engineering
    Permanent Link: http://hdl.handle.net/11104/0306716
     
     
    6.
    0376555 - ÚI 2013 CZ eng V - Research Report
    Rohn, Jiří
    (Z; z)-Solutions.
    Prague: ICS AS CR, 2012. 3 s. Technical Report, V-1159.
    Institutional research plan: CEZ:AV0Z10300504
    Keywords : interval linear equations * (Z; z)-solution * AE-solution * characterization * tolerance solution * control solution
    Subject RIV: BA - General Mathematics
    Permanent Link: http://hdl.handle.net/11104/0216966
    FileDownloadSizeCommentaryVersionAccess
    v1159-12.pdf27143.8 KBOtheropen-access
     
     

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