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0375695 - FZÚ 2012 RIV GB eng J - Journal Article
Gergely, G. - Gurban, S. - Menyhard, M. - Jablonski, A. - Zemek, Josef - Goto, K.
Experimental determination of the electron elastic backscattering probability and the surface excitation parameter for Si, Ni, Cu, and Ag at 0.5 and 1 KeV.
Surface and Interface Analysis. Roč. 43, č. 11 (2011), s. 1365-1370. ISSN 0142-2421. E-ISSN 1096-9918
R&D Projects: GA ČR GA202/09/0428
Institutional research plan: CEZ:AV0Z10100521
Keywords : backscattering probability * SEP * EPES * AREPES * AES * XPS
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.180, year: 2011
Permanent Link: http://hdl.handle.net/11104/0208283