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0374576 - ÚFE 2013 RIV CZ eng C - Conference Paper (international conference)
Muller, M. - Žďánský, Karel - Zavadil, Jiří - Piksová, K.
Study of layers of metal nanoparticles on semiconductor wafers for hydrogen detection.
NANOCON 2011, Conference Proceedings, 3 rd International Conference. Brno: TANGER Ltd., Ostrava, 2011, s. 550-554. ISBN 978-80-87294-27-7.
[NANOCON 2011, 3 rd International Conference. Brno (CZ), 21.09.2011-23.09.2011]
Institutional research plan: CEZ:AV0Z20670512
Keywords : semiconductor devices * nanostructures * sensors
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0216250