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0372183 - FZÚ 2012 RIV GB eng J - Journal Article
Wierzchowski, W. - Wieteska, K. - Balcer, T. - Klinger, D. - Sobierajski, R. - Zymierska, D. - Chalupský, Jaromír - Hájková, Věra - Burian, Tomáš - Gleeson, A.J. - Juha, Libor - Tiedtke, K. - Toleikis, S. - Vyšín, Luděk - Wabnitz, H. - Gaudin, J.
X-ray topographic investigation of the deformation field around spots irradiated by FLASH single pulses.
Radiation Physics and Chemistry. Roč. 80, č. 10 (2011), s. 1036-1040. ISSN 0969-806X. E-ISSN 1879-0895
R&D Projects: GA AV ČR KAN300100702; GA MŠMT LC510; GA ČR(CZ) GAP108/11/1312; GA MŠMT(CZ) LC528; GA MŠMT LA08024; GA AV ČR IAAX00100903; GA MŠMT(CZ) ME10046
Institutional research plan: CEZ:AV0Z10100523
Keywords : silicon * FLASH irradiation * x-ray topography * deformation fields
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.227, year: 2011
Permanent Link: http://hdl.handle.net/11104/0205557