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0469297 - ÚFP 2017 RIV US eng C - Conference Paper (international conference)
Špína, Michal - Procháska, František - Melich, Radek
Scratch and dig analysis for Metis mirrors surfaces defects evaluation.
Proceedings of SPIE 10151, Optics and Measurement International Conference 2016. Vol. 10151. Bellingham: SPIE, Society of Photo-Optical Instrumentation Engineers, 2016 - (Kovačičinová, J.), č. článku 101510W. SPIE. ISBN 978-1-5106-0753-8. ISSN 0277-786X.
[OAM 2016, Optics and Measurement International Conference 2016. Liberec (CZ), 11.10.2016-14.10.2016]
R&D Projects: GA MŠMT(CZ) LO1206
Institutional support: RVO:61389021
Keywords : Scratch and Dig * surface imperfections * optical surface * spot equivalent diameter * line equivalent width * surface quality measurement
Subject RIV: JS - Reliability ; Quality Management, Testing
Result website:
http://dx.doi.org/10.1117/12.2256634DOI: https://doi.org/10.1117/12.2256634
Permanent Link: http://hdl.handle.net/11104/0267105
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0312592 - FZÚ 2009 RIV NL eng J - Journal Article
Honda, Shinya - Mates, Tomáš - Rezek, Bohuslav - Fejfar, Antonín - Kočka, Jan
Microscopic study of the H₂O vapor treatment of the silicon grain boundaries.
[Mikroskopická studie ošetřování hranic zrn v křemíku vodní parou.]
Journal of Non-Crystalline Solids. Roč. 354, č. 19-25 (2008), s. 2310-2313. ISSN 0022-3093. E-ISSN 1873-4812
R&D Projects: GA MŠMT(CZ) LC06040; GA AV ČR KAN400100701; GA ČR(CZ) GD202/05/H003; GA AV ČR IAA1010316; GA MŠMT LC510; GA AV ČR IAA1010413; GA AV ČR KJB100100512; GA MŽP(CZ) SN/3/172/05
Institutional research plan: CEZ:AV0Z10100521
Keywords : polycrystalline silicon films * H₂O vapor treatment * potential * crystalline disorder * stress * defects * passivation
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.449, year: 2008 ; AIS: 0.542, rok: 2008
DOI: https://doi.org/10.1016/j.jnoncrysol.2007.09.107
Permanent Link: http://hdl.handle.net/11104/0163616