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0304177 - URE-Y 20030035 RIV CZ eng C - Conference Paper (international conference)
Franc, J. - Janda, Pavel - Novotný, Jan
Geometrical aspects of connection between surface reggedness and resistance of thin films.
Pilsen: University of West Bohemia, 2003. ISBN 80-7082-951-6. In: Applied Electronics 2003. - (Pinker, J.), s. 51-54
[Applied Electronics 2003. Pilsen (CZ), 10.09.2003-11.09.2003 (K)]
R&D Projects: GA AV ČR KSK1010104 Projekt 04/01:4046
Institutional research plan: CEZ:AV0Z2067918
Keywords : optoelectronic devices * epitaxial layers * measurement
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0114318