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0304012 - URE-Y 20020103 HU eng A - Abstract
Vaniš, Jan - Chow, D. H. - Pangrác, Jiří - Šroubek, Filip - McGill, T. C. - Walachová, Jarmila
Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope BEEM with InAs as based electrode.
Budapest: Rese, 2002. Book of Abstracts EXMATEC'2002. s. 176
[EXMATEC 2002 - International Workshop on Expert Evaluation & Control of Compounds Semiconductor Materials & Technologies /6./. 26.05.2002-29.05.2002, Budapest]
R&D Projects: GA AV ČR KSK1010104 Projekt 04/01:4045
Institutional research plan: CEZ:AV0Z2067918
Keywords : field emission electron microscopy * semiconductor qunatum wells * spectroscopy
Subject RIV: BM - Solid Matter Physics ; Magnetism
Permanent Link: http://hdl.handle.net/11104/0114156