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  1. 1.
    0132048 - FZU-D 980258 RIV US eng J - Journal Article
    Vorlíček, Vladimír - Železný, Vladimír - Tiwari, A. N. - Krejci, M. - Zogg, H.
    Determination of the crystallographic orientation of CuInSe2 thin films by Raman and infrared spectroscopy.
    Journal of Applied Physics. Roč. 82, - (1997), s. 5484-5487. ISSN 0021-8979. E-ISSN 1089-7550
    Impact factor: 1.630, year: 1997
    Permanent Link: http://hdl.handle.net/11104/0030088
     
  2. 2.
    0312725 - ÚMCH 2009 RIV GB eng J - Článek v odborném periodiku
    Kříž, Jaroslav - Dybal, Jiří - Budka, J. - Makrlík, E.
    NMR and theoretical study of the cooperative interaction of hydrated proton with dibenzo-24-crown-8.
    [NMR a teoretická studie kooperativní interakce hydratovaného protonu s dibenzo-24- crownem-8.]
    Magnetic Resonance in Chemistry. Roč. 46, č. 11 (2008), s. 1015-1024. ISSN 0749-1581. E-ISSN 1097-458X
    Grant CEP: GA AV ČR 1ET400500402
    Výzkumný záměr: CEZ:AV0Z40500505
    Klíčová slova: dibenzo-24- crown-8 * NMR exchange dynamics * crown protonation * DFT calculations
    Kód oboru RIV: CD - Makromolekulární chemie
    Impakt faktor: 1.443, rok: 2008 ; AIS: 0.453, rok: 2008
    DOI: https://doi.org/10.1002/mrc.2306
    Trvalý link: http://hdl.handle.net/11104/0163711
     
  3. 3.
    0481460 - ÚFP 2018 RIV GB eng J - Článek v odborném periodiku
    Rabinski, M. - Jakubowski, L. - Malinowski, K. - Sadowski, M. J. - Zebrowski, J. - Jakubowski, M.J. - Mirowski, R. - Weinzettl, Vladimír - Ficker, Ondřej - Mlynář, Jan - Pánek, Radomír - Papřok, Richard - Vlainic, Milos
    Development of a Cherenkov-type diagnostic system to study runaway electrons within the COMPASS tokamak.
    Journal of Instrumentation. Roč. 12, October (2017), č. článku C10014. ISSN 1748-0221. E-ISSN 1748-0221.
    [European Conference on Plasma Diagnostics (ECPD2017)/2./. Bordeaux, 18.04.2017-21.04.2017]
    Grant CEP: GA MŠMT(CZ) LM2015045
    Institucionální podpora: RVO:61389021
    Klíčová slova: Nuclear instruments and methods for hot plasma diagnostics * Plasma diagnostics - probes
    Obor OECD: 2.11 Other engineering and technologies
    Impakt faktor: 1.258, rok: 2017 ; AIS: 0.392, rok: 2017
    Web výsledku:
    http://iopscience.iop.org/article/10.1088/1748-0221/12/10/C10014DOI: https://doi.org/10.1088/1748-0221/12/10/C10014
    Trvalý link: http://hdl.handle.net/11104/0277165
     
  4. 4.
    0131798 - FZU-D 980282 RIV GB eng J - Článek v odborném periodiku
    Förster, E. - Fill, E. E. - Gäbel, K. - He, H. - Missalla, T. - Renner, Oldřich - Uschmann, I. - Wark, J. S.
    X-ray emission spectroscopy.
    Journal of Quantitative Spectroscopy and Radiative Transfer. Roč. 51, 1/2 (1994), s. 101-111. ISSN 0022-4073. E-ISSN 1879-1352
    Impakt faktor: 1.600, rok: 1994
    Trvalý link: http://hdl.handle.net/11104/0029844
     
  5. 5.
    0103235 - UFP-V 20040104 RIV CZ eng C - Conference Paper (international conference)
    Ctibor, Pavel - Sedláček, J. - Neufuss, Karel
    Relative permitivity and loss factor of plasma sprayed glass and glassceramics.
    [Relativní permitivita a ztrátový činitel plazmově stříkaného skla a sklokeramiky.]
    Proceedings of the 14th Joint Seminar "Development of Materials Science in Research and Education". Praha, 2004, s. 5-6. ISBN 80-7345-032-1.
    [Development of Materials Science in Research and Education - DMS-RE 2004 /14./. Lednice (CZ), 31.08.2004-03.09.2004]
    Institutional research plan: CEZ:AV0Z2043910
    Keywords : -
    Subject RIV: JH - Ceramics, Fire-Resistant Materials and Glass
    Permanent Link: http://hdl.handle.net/11104/0010551
     
  6. 6.
    0303819 - URE-Y 20010057 RIV US eng C - Conference Paper (international conference)
    Žďánský, Karel - Pekárek, Ladislav - Kacerovský, Pavel
    Evaluation of InP:Ti and InP:Mn and its use for particle detectors.
    Piscataway: IEEE, 2001. ISBN 0-7803-6506-2. In: 2000 IEEE Nuclear Symposium Conference Record., s. 4/132-4/136
    [2000 IEEE Nuclear Symposium Conference Record. Lyon (FR), 15.10.2000-30.10.2000 (K)]
    R&D Projects: GA ČR GA106/99/1563; GA AV ČR KSK1010601 Projekt 7/96/K:4074; GA AV ČR KSK1010104 Projekt 04/01:4044
    Institutional research plan: CEZ:AV0Z2067918
    Keywords : semiconductor materials * particle detectors
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    Permanent Link: http://hdl.handle.net/11104/0114003
     

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