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    1.
    0161452 - SLCHPL-S 20010021 RIV SIGLE CZ eng M - Monography Chapter
    Nagels, P. - Mertens, R. - Tichý, Ladislav
    Structural characterization amorphous GexSe100-x by infrared and Raman spectroscopy.
    Properties and Application of Amorphous Materials. Amsterdam: Kluwer Academic Publisher, 2001 - (Thorpe, M.; Tichý, L.), s. 25-34. ISBN 0-7923-6811-8
    Institutional research plan: CEZ:AV0Z4050913
    Keywords : amorphous chalcogenides * raman spectroscopy * structure
    Subject RIV: CA - Inorganic Chemistry
    Permanent Link: http://hdl.handle.net/11104/0058799
     
     

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