0131678 - FZU-D 980173 RIV NL eng J - Journal Article
Tarasenko, A. A. - Jastrabík, Lubomír - Chvostová, Dagmar - Sobota, Jaroslav - Novák, J. (Editor)
An ellipsometric study of Ni, Mo and NixN films deposited on Si.
Thin Solid Films. 313-314, - (1998), s. 314-318. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA AV ČR IAA2010536
Impact factor: 1.019, year: 1998
Permanent Link: http://hdl.handle.net/11104/0029733