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0131561 - FZU-D 980618 RIV GB eng J - Journal Article
Hartmanová, M. - Thurzo, I. - Jergel, M. - Bartoš, J. - Kadlec, Filip - Železný, Vladimír - Tunega, D. - Kundracik, F. - Chromik, S. - Brunel, M.
Characterization of yttria-stabilized zirconia thin films deposited by electron beam evaporation on silicon substrates.
Journal of Materials Science. Roč. 33, - (1998), s. 969-975. ISSN 0022-2461. E-ISSN 1573-4803
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 0.632, year: 1998
Permanent Link: http://hdl.handle.net/11104/0029620